Our services

What We Do

Photo and Optical Properties Measurements

UV/VIS/NIR spectroscopy [JASCO V-770, Japan

Measuring the optical properties of materials (liquid, powder and thin films) such as Absorbance, Transmission and Reflection. Calculating Band Gap and Film Thickness.

Spectrofluorophotometer (PL) [RF-5301 Pc, Japan]

Photoluminescence (PL) spectra detection. It measures Photoluminescence (PL) s pectra for powder, thin film and solution. Also give the PL signal (excitation-emission and synchronous spectra

Photocatalytic Reactor

Testing of catalyst performance for heterogenous and Homogenous photocatalysts.

Physical Properties Measurements

Particle Size Analyzer [Horiba, LB-500, UK]

Measuring the particle size in the range of 3 nm up to 6 μm using Dynamic light scattering.

Densitometer [Ultra-pycnometer 1000, USA]

Density Analysis of Solids and Powders by knowing its mass and its volume through insertion of gas into cup with known volume.

Surface area &pore size analysis [Belsorb III, Japan]

BET surface area, Langmuir surface area, adsorption and desorption isotherms, pore size distribution, micropore volume.

Thin Film Processing and Fabrication

Vacuum spin coater [VTC-100, USA]

Deposition of thin /thick film on different substrate.

3 Target Plasma sputtering coaters device [VTC-16-3HD, USA]

Thin film deposition using plasma sputter technique.

Slot Die Coater [Ossila L2005A1, UK]

Advanced thin-film deposition technique.

Electrical and Electromagnetic Properties Measurements

Potentiostate/ Galvanostate [Parastate 2273, USA]

Electro/ Electrochemical characterization of material. Measuring; I-t Curve, I-V curve, electrochemical impedance spectroscopy measurement and Mott–Schottky measurement.

Hall Effect measurement system [Ecopia HMS-5500, South Korea]

Measuring the electrical properties of semiconductors, ceramics Compressed powder, thin films using Ecopia, Bridge Technology.

Solar Light Source Simulators

Solar Light Source Simulators

Solar Light Source Simulator [XLH-S, Canada]

Providing solar light source for visible light photocatalytic activity measurement and photoelectrochemical properties.

Gas Chromatography and Surface Properties Measurements

Gas chromatography) GC/MS/MS( [GC Trace 1300/ MS TSQ8000, UK]

Temperature programmed desorption (TPD) [BEL- Cat, Japan]

Temperature programmed desorption (TPD) [BEL- Cat, Japan] Chemosorption properties of materials. It measures active (acid/basic) sites of materials. Also can follow oxidation/reduction behavior of catalysts and metal distribution of metal on substrate.

Materials Synthesis and Processing

Microwave synthesis [Multiwave 5000, Austria]

Synthesis the material using microwave energy.

Freeze Dryer [Lyovapor L-200, Switzerland]

Freezing material and drying under vacuum to a temperature -50 °C.

Centrifuge [Multifuge X3R, UK]

Centrifuge the material at high speed with large volumes

High Temperature Synthesis and Processing of Materials

Muffle Furnace [Nabertherm L9/12, Germany]

Heating samples up to 1200 oC in air.

Three-Zone Tube Furnace [Carbolite TZF 12/65/550, UK]

Heating sample up to 1500 oC under controoled gas atmosphere.

Vacuum Oven

Heating and drying sensitive samples under vacuum